Fluorine-free heteroaromatic photoacid generators and...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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C430S313000, C430S921000, C430S922000, C562S030000

Reexamination Certificate

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08034533

ABSTRACT:
Fluorine-free photoacid generators and photoresist compositions containing fluorine-free photoacid generators are enabled as alternatives to PFOS/PFAS photoacid generator-containing photoresists. The photoacid generators are characterized by the presence of a fluorine-free heteroaromatic sulfonate anionic component. The photoacid generators preferably contain an onium cationic component, more preferably a sulfonium cationic component. The photoresist compositions preferably contain an acid sensitive imaging polymer. The compositions are especially useful for forming material patterns using 193 nm (ArF) imaging radiation.

REFERENCES:
patent: 4855017 (1989-08-01), Douglas
patent: 5229254 (1993-07-01), Lohaus et al.
patent: 5362663 (1994-11-01), Bronner et al.
patent: 5429710 (1995-07-01), Akiba et al.
patent: 5558978 (1996-09-01), Sch adeli et al.
patent: 5562801 (1996-10-01), Nulty
patent: 5618751 (1997-04-01), Golden et al.
patent: 5744376 (1998-04-01), Chan et al.
patent: 5801094 (1998-09-01), Yew et al.
patent: 5821469 (1998-10-01), Shanmugham
patent: 5948570 (1999-09-01), Kornblit et al.
patent: 6203965 (2001-03-01), Cameron et al.
patent: 6436606 (2002-08-01), Hatakeyama et al.
patent: 6627391 (2003-09-01), Ito et al.
patent: 6635401 (2003-10-01), Li et al.
patent: 6730452 (2004-05-01), Brock et al.
patent: 6756180 (2004-06-01), Li et al.
patent: 6811961 (2004-11-01), Cameron et al.
patent: 6902874 (2005-06-01), Li et al.
patent: 7026093 (2006-04-01), Thackeray et al.
patent: 7063931 (2006-06-01), Li et al.
patent: 7087356 (2006-08-01), Khojasteh et al.
patent: 7192686 (2007-03-01), Meagley
patent: 2003/0008230 (2003-01-01), Li et al.
patent: 2005/0158654 (2005-07-01), Yuch et al.
patent: 2005/0277755 (2005-12-01), Hamada et al.
patent: 2006/0188810 (2006-08-01), Ohsawa et al.
patent: 2006/0216643 (2006-09-01), Li et al.
patent: 2007/0172769 (2007-07-01), Kanna et al.
patent: 2009/0176173 (2009-07-01), Glodde et al.
Hiroshi Ito; Chemical Amplification resists for microlithography—Adv. Polym. Sci. (2005) 172; pp. 37-245.
Everyscience—Glossary-E; http://www.everyscience.com/Chemistry/Glossary/E.php—pp. 1-3, Dec. 7, 2007.
Yasuhiro Suzuke, et al.; Photoacid Generators in Chemically Amplified Resists—SPIE vol. 3333 (1998)—pp. 735-746.
Ramakrishnan Ayothi, et al.; All-Organic Non-PFOS Nonionic Photoacid Generating Compounds With Functionalized Fluoroorganic Sulfonate Motif for Chemically Amplified Resists—Proc. of SPIE vol. 6153, 61530J, (2006) pp. 61530J-1-61530J-7.
Ramakrishnan Ayothi, et al.; New PFOS Free Photoresist Systems for EUV Lithography—Journal of Photopolymer Science and Technology, vol. 19, No. 4 (2006) pp. 515-520.
Kyung-Min Kim, et al.; Synthesis, Characterization and Lithography Performance of Phtotacid Generator With Short Perfluoroalkyl Anion—Polymer Bulletin 55, (2005) pp. 333-340.
E. Reichmanis, et al.; Chemical Amplification Mechanisms for Microlithography—American Chemical Society; Chem. Mater. 1991, 3, pp. 394-407.
James V. Crivello; The Discovery and Development of Onium Salt Cationic Photoinitiators—Journal of Polymer Science; Part A; Polymer Chemistry, vol. 37, (1999), pp. 4241-4254.
Mingxing Wang, et al.; Novel Polymeric Anionic Photoacid Generators (PAGs) and Photoresists for Sub-100 nm Patterning by 193 nm Lithography—Advances in Resist Materials and Processing Technology XXIV, edited by Qinghuang Lin—Proc. of SPIE vol. 6519, 6519C, (2007).
Mary Kate Boggiano, et al.; Photoresists for CO2-Based Next-Generation Microlithography—Advances in Resist Technology and Processing XXII, Edited by John L. Sturtevant—Proc. of SPIE vol. 5753 (SPIE, Bellingham, WA, 2005) pp. 487-490.
International Search Report and WO-PCT/US2009/030789 Inter'l filing date: Jan. 13, 2009.

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