Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Junction field effect transistor
Patent
1992-08-07
1993-12-28
Wojciechowicz, Edward
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Junction field effect transistor
257192, 257286, 257472, 257619, 257622, H01L 2980
Patent
active
052742571
ABSTRACT:
A field effect transistor is disclosed in which a source region and a drain region are formed to be reverse mesa on a semi-insulating semiconductor substrate with an insulating layer thereon by using a crystal growth characteristic corresponding to the crystal orientation. A channel layer and a gate electrode are formed by self-alignment on the upper part of a void formed according to the reverse mesa of the source and the drain regions, so that the channel layer and the semiconductor substrate are electrically separated by the void. By such a construction, a leakage current and backgating effect are removed, and a fast field effect transistor is attained owing to the reduction of an effective channel length and a gate resistance.
REFERENCES:
patent: 3823352 (1974-07-01), Pruniaux et al.
patent: 4499481 (1985-02-01), Greene
Matsunaga, N. et al. "Half Micron Gate GaAs . . . " in GaAs Ie. Symposium, Tokyo, Japan, 1989, pp. 147-150.
Palevski, A. et al. "Regrown ohmic contacts . . . " in Appl. Phys. Lett. 56(2) N.Y. 1990, pp. 171-173.
Asai, H. et al. "Lateral Growth Process . . . " in J. Electrochem. Soc.: Solid State Science and Technology (1985 Oct.) pp. 2445-2453.
Kim Chang T.
Kwon Young S.
Samsung Electronics Co,. Ltd.
Wojciechowicz Edward
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