Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate
2006-04-18
2006-04-18
Hoang, Huan (Department: 2827)
Static information storage and retrieval
Read/write circuit
Including reference or bias voltage generator
C365S177000, C365S105000
Reexamination Certificate
active
07031203
ABSTRACT:
A DRAM memory cell uses a single transistor to perform the data storage and switching functions of a conventional cell. The transistor has a floating channel body which stores a potential that corresponds to one of two digital data values. The transistor further includes a gate connected to a first word line, a drain connected to a second word line, and a source connected to a bit line. By setting the word and bit lines to specific voltage states, the channel body stores a digital one potential as a result of impact ionization and a digital zero value as a result of forward bias of body-to-source junction.
REFERENCES:
patent: 2003/0231521 (2003-12-01), Ohsawa
patent: 2005/0063224 (2005-03-01), Fazan et al.
Takashi Ohsawa et al., Memory Design Using One Transistor Gain Cell on SOI, ISSCC 2002, Session 9, Dram and Ferrolelectric Memoirs, 3 pgs.
De Vivek
Keshavarzi Ali
Khellah Muhammad
Paillet Fabrice
Somasekhar Dinesh
Fleshner & Kim LLP
Hoang Huan
Intel Corporation
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