Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate
2005-06-07
2005-06-07
Hoang, Huan (Department: 2818)
Static information storage and retrieval
Read/write circuit
Including reference or bias voltage generator
C365S149000, C365S189011
Reexamination Certificate
active
06903984
ABSTRACT:
A DRAM memory cell uses a single transistor to perform the data storage and switching functions of a conventional cell. The transistor has a floating channel body which stores a potential that corresponds to one of two digital data values. The transistor further includes a gate connected to a first word line, a drain connected to a second word line, and a source connected to a bit line. By setting the word and bit lines to specific voltage states, the channel body stores a digital one potential as a result of impact ionization and a digital zero value as a result of forward bias of body-to-source junction.
REFERENCES:
patent: 5877978 (1999-03-01), Morishita et al.
patent: 6341087 (2002-01-01), Kunikiyo
Takashi Ohsawa et al. “Memory Design Using One-Transistor Gain Cell on SOI,” ISSCC 2002, Session 9, Dram and Ferrorelectric Memoirs.
De Vivek
Keshavarzi Ali
Khellah Muhammad
Paillet Fabrice
Somasekhar Dinesh
Fleshner & Kim LLP
Hoang Huan
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