Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Bump leads
Reexamination Certificate
2011-08-02
2011-08-02
Pham, Hoai v (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Bump leads
C257S780000, C257SE23020
Reexamination Certificate
active
07989953
ABSTRACT:
A semiconductor package includes a semiconductor substrate a semiconductor substrate having source and drain regions formed therein, an intermediate routing structure to provide electrical interconnects to the source and drain regions, a dielectric layer formed over the intermediate routing structure, and an under-bump-metallization (UBM) stack. The intermediate routing structure includes an outermost conductive layer, and the dielectric layer has an opening positioned over a portion of the intermediate layer routing structure. The UBM stack includes a conductive base layer formed over the dielectric layer and electrically connected to the outermost conductive layer through the opening, and a thick conductive layer formed on the base layer. A conductive bump is positioned on the UBM stack and laterally spaced from the opening.
REFERENCES:
patent: 6713823 (2004-03-01), Nickel
patent: 7727879 (2010-06-01), Lin et al.
patent: 2006/0049483 (2006-03-01), Lin et al.
patent: 2008/0035959 (2008-02-01), Jiang
Jergovic Ilija
Lacap Efren M.
Fish & Richardson P.C.
Pham Hoai v
Volterra Semiconductor Corporation
LandOfFree
Flip chip power switch with under bump metallization stack does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Flip chip power switch with under bump metallization stack, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Flip chip power switch with under bump metallization stack will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2644758