Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2007-01-16
2007-01-16
Tran, Michael (Department: 2827)
Static information storage and retrieval
Read/write circuit
Testing
C365S236000
Reexamination Certificate
active
10991434
ABSTRACT:
A method of controlling an internal address counter which provides a count used in accessing a storage cell array to provide increased flexibility in the performance of a test on the array, comprising, rendering a normal overflow condition of the counter modified, thereby enabling alteration of the count provided by the counter in accordance with the requirements of the test being performed on the array.
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Fekih-Romdhane Khaled
Hokenmaier Wolfgang
Hummler Klaus
Edell Shapiro & Finnan LLC
Infineon - Technologies AG
Tran Michael
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