Flexible core for enhancement of package interconnect...

Active solid-state devices (e.g. – transistors – solid-state diode – Lead frame – On insulating carrier other than a printed circuit board

Reexamination Certificate

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Details

C257SE23174, C257SE23007, C257SE23077, C257SE23194, C257SE23008, C257SE23069, C257SE23173, C257S701000, C257S758000, C257S759000, C257S703000, C257S778000, C257S700000, C361S760000, C361S748000

Reexamination Certificate

active

07633142

ABSTRACT:
An IC package is disclosed that comprises a core region disposed between upper and lower build-up layer regions. In one embodiment, the core region comprises a low modulus material. In an alternative embodiment the core region comprises a medium modulus material. In an alternative embodiment, the core material is selected based upon considerations such as it modulus, its coefficient of thermal expansion, and/or the resulting total accumulated strain. In an alternative embodiment, boundaries with respect to the softness of the core material are established be considering the reflective density in opposing conductive build-up layers above and below the core region.

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