Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-05-19
2009-10-27
Booth, Richard A. (Department: 2812)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C438S261000, C257SE27078
Reexamination Certificate
active
07608885
ABSTRACT:
A non-volatile memory device has a gate dielectric film formed between a floating gate and a control gate. The gate dielectric film is formed by forming an oxide film and a ZrO2/Al2O3/ZrO2(ZAZ) film. Accordingly, the reliability of non-volatile memory devices can be improved while securing a high coupling ratio.
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patent: 2005/0275012 (2005-12-01), Nara et al.
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patent: 2007/0026608 (2007-02-01), Choi et al.
patent: 10-2005-0070860 (2005-07-01), None
Hong Kwon
Jang Min Sik
Park Eun Shil
Booth Richard A.
Hynix / Semiconductor Inc.
Townsend and Townsend / and Crew LLP
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