Flash memory device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S315000, C257S510000, C257SE21422, C257SE29304, C438S257000, C438S264000, C438S430000

Reexamination Certificate

active

07358558

ABSTRACT:
A floating gate of a flash memory device is formed in a moat formed in an isolation film. Therefore, an electric field applied between a control gate and a channel region upon cycling can be precluded or mitigated. A distance between the control gate and the channel region is set greater than a predetermined value. Therefore, an electric field applied between the control gate and the channel region upon cycling can be mitigated. As a result, a data retention characteristic and an endurance characteristic can be improved.

REFERENCES:
patent: 5087584 (1992-02-01), Wada et al.
patent: 6069382 (2000-05-01), Rahim
patent: 6448606 (2002-09-01), Yu et al.
patent: 6737321 (2004-05-01), Lee
patent: 6964913 (2005-11-01), Dong et al.
patent: 2003/0042530 (2003-03-01), Nakagawa
patent: 2003/0215999 (2003-11-01), Chern et al.
patent: 2006/0091445 (2006-05-01), Utsuno
patent: 498503 (2002-08-01), None

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