Thermal measuring and testing – Thermal testing of a nonthermal quantity – Of susceptibility to thermally induced deteriouration – flaw,...
Patent
1989-11-02
1991-08-13
Cuchlinski, Jr., William A.
Thermal measuring and testing
Thermal testing of a nonthermal quantity
Of susceptibility to thermally induced deteriouration, flaw,...
374 5, 374141, 374142, 738656, 73662, 73571, G01N 2572, G01N 2500, G01N 2900, G01N 3300
Patent
active
050392280
ABSTRACT:
A fixtureless environmental screening device is provided for the testing of mechanical, electromechanical and electrical devices. The apparatus uses a relatively incompressible fluid having a high heat capacity and a high heat of vaporization to transfer heat and vibration to a device to be tested. The heat transfer characteristics of the fluid permits a device tested to undergo rapid temperature change while being simultaneously subjected to vibrational cycling. By utilizing a fluid as a vibration transmission medium expensive fixtures are avoided so that devices of a wide variety of shapes and sizes may be readily tested. The dielectric properties of the working fluid permits energization of electrical devices during the course of vibration and temperature cycling.
REFERENCES:
patent: H229 (1987-03-01), Phillips
patent: 2523322 (1950-09-01), Ornstein et al.
patent: 3273802 (1966-09-01), Hull, Jr.
patent: 3327536 (1967-06-01), Fitzgerald
patent: 3365930 (1968-01-01), Arias
patent: 4092869 (1978-06-01), Kimball
patent: 4519718 (1985-05-01), Staffin et al.
patent: 4575257 (1986-03-01), Ogura et al.
patent: 4729246 (1988-03-01), Melgaard et al.
patent: 4733973 (1988-03-01), Machak et al.
patent: 4787752 (1988-11-01), Fraser et al.
patent: 4812750 (1989-03-01), Keel et al.
patent: 4817447 (1989-04-01), Kashima et al.
patent: 4854726 (1989-08-01), Lesley et al.
patent: 4879905 (1989-11-01), Chen et al.
patent: 4955726 (1990-09-01), Bargigia et al.
Gunn, J. E. et al., "Highly Accelerated Stress Test," IBM Technical Disclre Bulletin, vol. 24, No. 4 (Sep. 1981).
Iowa Air Crash Laid to Metallurgical Flaw by Paul Houston, Oct. 29, 1989, Los Angeles Times, Los Angeles, CA.
Cuchlinski Jr. William A.
Fendelman Harvey
Gutierrez Diego F. F.
Keough Thomas Glenn
Lipovsky Peter A.
LandOfFree
Fixtureless environmental stress screening apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Fixtureless environmental stress screening apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fixtureless environmental stress screening apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1524173