First time silicon and proto test cell notification

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000

Reexamination Certificate

active

07028276

ABSTRACT:
A method for notification of a first new cell is disclosed. The method generally includes the steps of (A) generating a first report for a circuit design comprising a plurality of first cells including the first new cell by executing a rule check on the circuit design, (B) comparing the first report with a database comprising a plurality of second cells already manufactured and (C) notifying a client of the first new cell in response to the first new cell not matching any of the second cells.

REFERENCES:
patent: 5050091 (1991-09-01), Rubin
patent: 6055366 (2000-04-01), Le et al.
patent: 6643683 (2003-11-01), Drumm et al.
patent: 6668360 (2003-12-01), Liu
patent: 2003/0084418 (2003-05-01), Regan

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