Fine-grained thermal control in memory subsystems

Details Fine-grained thermal control in memory subsystems Fine-grained thermal control in memory subsystems

2005-02-01

2005-02-01

Elamin, A. (Department: 2116)

Electrical computers and digital processing systems: support

Computer power control

C318S268000, C361S689000, C361S688000, C361S695000, C702S099000, C702S130000, C702S132000

Reexamination Certificate

active

06851064

ABSTRACT:
An apparatus and method for monitoring memory system performance and controlling an operating parameter is provided. A plurality of digital events indicative of memory system operations is detected, from which a subset of digital events to count is periodically selected, the subset being those digital events occurring during a sampling window time interval. Responsive to each digital event of the subset, a transistor is switched on to conduct current from a power supply to a capacitor. The transistor is biased by the capacitor to operate in a constant current region providing a substantially fixed amount of charge added to the capacitor responsive to each digital event of the subset. The operating parameter is controlled responsive to the charge accumulated in the capacitor, representative of the count of digital events in the subset. In one embodiment, the sampling window time interval is selected pseudo-randomly within a periodic base time interval.

REFERENCES:
patent: 5243637 (1993-09-01), Flaherty et al.
patent: 5774704 (1998-06-01), Williams
patent: 5961577 (1999-10-01), Soenen et al.
patent: 5963887 (1999-10-01), Giorgio
patent: 6021076 (2000-02-01), Woo et al.
patent: 6134667 (2000-10-01), Suzuki et al.
patent: 6454362 (2002-09-01), Katsui et al.
patent: 6470289 (2002-10-01), Peters et al.
patent: 6494381 (2002-12-01), Bulthuis
patent: 6636910 (2003-10-01), Kung et al.
patent: 6643128 (2003-11-01), Chu et al.
patent: 6654894 (2003-11-01), Kaminski et al.
patent: 6760649 (2004-07-01), Cohen
patent: 6777900 (2004-08-01), Lee

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