Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2003-12-15
2008-09-09
Le, John H (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C324S1540PB, C381S058000, C455S067110, C702S124000
Reexamination Certificate
active
07424406
ABSTRACT:
Described are a filter characteristic measuring method and system capable of measuring a gain of an analog filter adapted in a DUT (Device Under Test) and a frequency response at a high speed, wherein the filter characteristic measuring method includes the steps of generating an impulse signal; applying the impulse signal to the DUT having an analog filter through a digital channel; and measuring a gain of the analog filter in the DUT and a frequency characteristic by using an output of the analog filter.
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Le John H
Mills & Onello LLP
Samsung Electronics Co,. Ltd.
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