Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – With means to increase breakdown voltage
Reexamination Certificate
2007-07-24
2007-07-24
Nhu, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Regenerative type switching device
With means to increase breakdown voltage
C257S484000, C257SE21001, C257SE21170, C438S140000
Reexamination Certificate
active
11067640
ABSTRACT:
There is here disclosed a film forming ring including a ring main body being made of an insulating material and formed in an annular shape along an edge of a substrate on which a film forming process by using a material gas in a plasma state is applied, and an inner rim of the ring main body being formed higher than its outside portion.
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Notification of Reasons for Rejection mailed May 9, 2006, issued by the Japanese Patent Office in counterpart Japanese Application No. 2004-056453 and English translation thereof.
Nishiyama Yukio
O Takashi
Ogihara Hirotaka
Ui Akio
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Kabushiki Kaisha Toshiba
Nhu David
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