Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2011-07-19
2011-07-19
Smith, Matthew (Department: 2823)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C118S704000, C257SE21170
Reexamination Certificate
active
07981794
ABSTRACT:
A barrier layer including a titanium film is formed at a low temperature, and a TiSixfilm is self-conformably formed at the interface between the titanium film and the base. In forming the TiSixfilm507, the following steps are repeated without introducing argon gas: a first step of introducing a titanium compound gas into the processing chamber to adsorb the titanium compound gas onto the silicon surface of a silicon substrate502; a second step of stopping introduction of the titanium compound gas into the processing chamber and removing the titanium compound gas remaining in the processing chamber; and a third step of generating plasma in the processing chamber while introducing hydrogen gas into the processing chamber to reduce the titanium compound gas adsorbed on the silicon surface and react it with the silicon in the silicon surface to form the TiSixfilm507.
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Amano Fumitaka
Narushima Kensaku
Wakabayashi Satoshi
Enad Christine
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Smith Matthew
Tokyo Electron Limited
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