Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Patent
1998-09-10
2000-12-26
Niebling, John F.
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
438790, H01L 2131, H01L 21469
Patent
active
061659169
ABSTRACT:
The present invention provides a method of forming a film, having the step of allowing a first chemical substance to be adsorbed on a surface of a silicon substrate by a gaseous phase method, and the step of introducing a gas containing a second chemical substance onto the substrate surface having the first chemical substance adsorbed thereon for forming a silicon compound layer on the silicon substrate, the silicon compound layer consisting essentially of a silicon compound formed by a reaction between the first chemical substance adsorbed on the substrate surface and the second chemical substance. The film-forming method of the present invention is featured in that one of the first and second chemical substances contains silicon and the other chemical substance contains an element other than silicon, that the step of forming the silicon compound layer is continued until the reaction between the first chemical substance and the second chemical substance is saturated, and that the step of allowing the first chemical substance to be adsorbed on the substrate surface and the step of forming the silicon compound layer are carried out alternately and a plurality of times.
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Itoh Hitoshi
Muraoka Kouichi
Kabushiki Kaisha Toshiba
Lindsay Jr. Walter L.
Niebling John F.
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