Film forming method

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Details

C438S585000, C438S649000, C438S681000, C438S685000

Reexamination Certificate

active

11141314

ABSTRACT:
A technique is provided that is capable of employing raw materials having no halogen, which has a high possibility of exerting a bad influence upon semiconductor elements, thereby to easily form molybdenum films (molybdenum silicide films or molybdenum nitride films) of which purity is high at a low temperature.A film forming material for forming molybdenum films, molybdenum silicide films, or tungasten nitride films is provided, wherein a Mo source of said film is one or more chemical compounds selected from the group consisting of a hexadimethylaminodimolybdenum, a hexaethylmethylaminodimolybdenum, and a hexadiethylaminodimolybdenum.

REFERENCES:
patent: 2005/0026428 (2005-02-01), Choi
patent: 2006/0067230 (2006-03-01), Machida et al.
patent: 2006/0068100 (2006-03-01), Machida et al.
patent: 2006/0068101 (2006-03-01), Machida et al.
patent: 2006/0068103 (2006-03-01), Machida et al.
patent: 2002-009298 (2002-01-01), None
patent: 2002-353458 (2002-12-01), None
patent: 2003-258121 (2003-09-01), None
patent: 2004-031484 (2004-01-01), None
patent: 2004-207481 (2004-07-01), None

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