Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2006-10-13
2008-05-20
Lebentritt, Michael S. (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C438S154000, C438S241000, C438S258000, C438S199000, C438S301000, C257SE21400, C257SE21404, C257SE21382
Reexamination Certificate
active
07374980
ABSTRACT:
A field effect transistor and a method of fabricating the field effect transistor. The field effect transistor includes: a silicon body, a perimeter of the silicon body abutting a dielectric isolation; a source and a drain formed in the body and on opposite sides of a channel formed in the body; and a gate dielectric layer between the body and an electrically conductive gate electrode, a bottom surface of the gate dielectric layer in direct physical contact with a top surface of the body and a bottom surface the gate electrode in direct physical contact with a top surface of the gate dielectric layer, the gate electrode having a first region having a first thickness and a second region having a second thickness, the first region extending along the top surface of the gate dielectric layer over the channel region, the second thickness greater than the first thickness.
REFERENCES:
patent: 5989946 (1999-11-01), Honeycutt
patent: 6395606 (2002-05-01), Huster et al.
patent: 6437390 (2002-08-01), Thapar
patent: 7015126 (2006-03-01), Wu et al.
patent: 7033868 (2006-04-01), Nakamura et al.
patent: 7045456 (2006-05-01), Murto et al.
patent: 7074660 (2006-07-01), Manger
patent: 7135401 (2006-11-01), Tran et al.
patent: 7273785 (2007-09-01), Dennard et al.
patent: 2005/0156238 (2005-07-01), Wen et al.
patent: 2006/0068556 (2006-03-01), Noda
patent: 2006/0102962 (2006-05-01), Saito
patent: 2007/0092990 (2007-04-01), Belyansky et al.
Anderson Brent Alan
Bryant Andres
Clark, Jr. William F.
Nowak Edward Joseph
Ahmadi Mohsen
International Business Machines - Corporation
Lebentritt Michael S.
Sabo William D.
Schmeiser Olsen & Watts
LandOfFree
Field effect transistor with thin gate electrode and method... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Field effect transistor with thin gate electrode and method..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Field effect transistor with thin gate electrode and method... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3984928