Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2008-07-30
2010-12-14
Picardat, Kevin M (Department: 2822)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C438S149000, C438S151000, C438S156000, C438S157000, C438S173000, C438S192000, C438S193000, C438S206000, C438S212000, C438S259000, C438S268000, C438S300000
Reexamination Certificate
active
07851283
ABSTRACT:
Therefore, disclosed above are embodiments of a multi-fin field effect transistor structure (e.g., a multi-fin dual-gate FET or tri-gate FET) that provides low resistance strapping of the source/drain regions of the fins, while also maintaining low capacitance to the gate by raising the level of the straps above the level of the gate. Embodiments of the structure of the invention incorporate either conductive vias or taller source/drain regions in order to electrically connect the source/drain straps to the source/drain regions of each fin. Also, disclosed are embodiments of associated methods of forming these structures.
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Anderson Brent A.
Ludwig Thomas
Nowak Edward J.
Au Bac H
Gibb I.P. Law Firm LLC
International Business Machines - Corporation
Picardat Kevin M
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