Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is
Reexamination Certificate
2006-05-23
2006-05-23
Munson, Gene M. (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Thin active physical layer which is
C257S024000, C257S288000, C257S347000, C257S390000, C977S726000
Reexamination Certificate
active
07049625
ABSTRACT:
A field effect transistor memory cell has a source region, a drain region, a channel region and a gate region, with the channel region extending from the source region to the drain region and being formed from at least one nanowire which has at least one defect such that charges can be trapped in the defects and released from the defects by a voltage applied to the gate region. A memory device built up from such memory cells and a method of manufacturing such memory cells is also disclosed.
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Burghard Marko
Cui Jingbiao
Kern Klaus
Max-Planck-Gesellschaft zur Fonderung der Wissenschaften E.V.
Munson Gene M.
Sierra Patent Group Ltd.
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