Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor
Reexamination Certificate
2005-11-09
2010-11-09
Bryant, Kiesha R (Department: 2891)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Amorphous semiconductor
C438S482000, C438S485000, C257SE21497
Reexamination Certificate
active
07829444
ABSTRACT:
Provided is a novel method for manufacturing a field effect transistor. Prior to forming an amorphous oxide layer on a substrate, ultraviolet rays are irradiated onto the substrate surface in an ozone atmosphere, plasma is irradiated onto the substrate surface, or the substrate surface is cleaned by a chemical solution containing hydrogen peroxide.
REFERENCES:
patent: 5635408 (1997-06-01), Sano et al.
patent: 6075256 (2000-06-01), Kaifu et al.
patent: 6379994 (2002-04-01), Sano et al.
patent: 7132373 (2006-11-01), Fukuhisa et al.
patent: 7189992 (2007-03-01), Wager, III et al.
patent: 7297977 (2007-11-01), Hoffman et al.
patent: 2003/0003621 (2003-01-01), Rhodes et al.
patent: 2003/0218222 (2003-11-01), Wager, III et al.
patent: 2004/0259383 (2004-12-01), Choi et al.
patent: 2005/0173734 (2005-08-01), Yoshioka et al.
patent: 2005/0199959 (2005-09-01), Chiang et al.
patent: 2006/0052641 (2006-03-01), Funahashi
patent: 2006/0079037 (2006-04-01), Hoffman et al.
patent: 2006/0108529 (2006-05-01), Saito et al.
patent: 2006/0113536 (2006-06-01), Kumomi et al.
patent: 2006/0113539 (2006-06-01), Sano et al.
patent: 2006/0113565 (2006-06-01), Abe et al.
patent: 2006/0150891 (2006-07-01), Ichinose et al.
patent: 05-251705 (1993-09-01), None
patent: 08-032094 (1996-02-01), None
patent: 2000-44236 (2000-02-01), None
patent: 2003-298062 (2003-10-01), None
patent: 2004-103957 (2004-04-01), None
patent: WO 03/098699 (2003-11-01), None
patent: WO 2004/038757 (2004-05-01), None
patent: WO 2005/088726 (2005-09-01), None
patent: WO 2005/093846 (2005-10-01), None
patent: WO 2005/093847 (2005-10-01), None
patent: WO 2005/093848 (2005-10-01), None
patent: WO 2005/093849 (2005-10-01), None
patent: WO 2005/093850 (2005-10-01), None
patent: WO 2005/093851 (2005-10-01), None
patent: WO 2005/093852 (2005-10-01), None
patent: WO 2006/051993 (2006-05-01), None
patent: WO 2006/051994 (2006-05-01), None
patent: WO 2006/051995 (2006-05-01), None
Narushima, A p-type amorphous oxide semiconductor and room temperature fabrication of amorphous oxide p-n heterojunction diodes, Adv. Mat. 15, 2003, 1409-1413.
Orita, (Philosophical Magazine, B81, 2001, pp. 501-515), Amorphous transparent conductive oxide InGaO3(ZnO)m: a Zn 4s conductor.
“Carrier Transport in Transparent Amorphous Oxide Semiconductor InGaZnO4”, Nomura et al.; Preprint 31a-ZA-6 of 51th Meeting of Union of applied Phys. Soc. , Mar. 2004, Tokyo University of Technology.
“Room Temperature Fabrication and Carrier Transport . . . (>10 cm2/Vs)”, Kamiya et al. ; Preprint 1a-F-5 of 65thMeeting of Appl. Phys. Soc., Sep. 2004, Tohoku Gakuen University.
Nomura et al., “Room-temperature Fabrication of Transparent Flexible Thin-film Transistors Using Amorphous Oxide Semiconductors,”Nature, vol. 432, 488-492 (2004).
Takagi et al., “Carrier Transport and Electronic Structure in Amorphous Oxide Semiconductor, a-InGaZnO4,”Thin Solid Films, vol. 486, 38-41 (2005).
Nomura et al., “Thin-Film Transistor Fabricated in Single-Crystalline Transparent Oxide Semiconductor,”Science, vol. 300, 1269-1272 (2003).
Hosono Hideo
Iwasaki Tatsuya
Kamiya Toshio
Nomura Kenji
Sano Masafumi
Bryant Kiesha R
Canon Kabushiki Kaisha
Fitzpatrick ,Cella, Harper & Scinto
Tokyo Institute of Technology
Yang Minchul
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