Field-effect transistor for one-time programmable nonvolatile me

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257391, 257392, 257393, 257356, H01L 2968

Patent

active

060406089

ABSTRACT:
A least one one-time programmable nonvolatile (NV) memory element uses a field-effect transistor (FET) as a selectively programmed element. A short duration applied drain voltage exceeding the FET's drain-to-source breakdown voltage results in a drain source resistance which is substantially unaffected by the voltages typically applied at the gate terminal. Since the programmed resistance is less than 200 ohms and a high programming voltage is not required, the present invention compares favorably with antifuse nonvolatile memory techniques. The nonvolatile memory element is implemented without adding complexity to a very large scale integrated (VLSI) circuit process.

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patent: 5428237 (1995-06-01), Yuzurihara et al.
patent: 5535158 (1996-07-01), Yamagata
patent: 5554553 (1996-09-01), Harari
patent: 5793090 (1998-08-01), Gardner et al.

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