Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-04-10
2007-04-10
Prenty, Mark V. (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S341000, C257S347000, C257S401000
Reexamination Certificate
active
10864098
ABSTRACT:
The present invention provides a MOSFET having a low on-state resistance and a high withstand voltage as well as a small output capacitance (C(gd), etc.). The MOSFET has a p-type base layer4and a n-type source layer5selectively formed on the surface of the p-type base layer.4. A n-type drain layer7is formed in a position apart from the p-type base layer4. On the surface of the region between the p-type base layer4and the n-type drain layer7, a n-type drift semiconductor layer12and a p-type drift semiconductor layer13are alternately arranged from the p-type base layer4to the n-type drain layer7. Further, in the region between the n-type source layer5and the n-type drain layer7, a gate electrode15is formed via a gate insulating film14. With the structure, the neighboring region of the gate electrode is depleted by a built in potential between the n-type drift semiconductor layer12and the p-type drift semiconductor layer13or by the potential of the gate electrode, when the gate electrode, source electrode, and drain electrode are at0potential.
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Aizawa Yoshiaki
Kitagawa Mitsuhiko
Hogan & Hartson LLP
Kabushiki Kaisha Toshiba
Prenty Mark V.
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