Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1991-05-28
1992-12-22
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
25022719, 25022727, G01B 902
Patent
active
051737434
ABSTRACT:
Apparatus and methods for reducing and preventing polarization fading in unbalanced measuring interferometers. An extended interferometer having a plurality of sensors and a compensating interferometer are used. They are driven from a pulsed optical signal source wherein the optical signal comprises sequences of two pulses each. To prevent polarization fading the polarization of a predetermined one of each two-pulse sequence is switched, preferably orthogonally, from sequence to sequence. Interference pulse output groups are produced for each two-pulse driving sequence. Each output group has the same number of usable pulses as the number of sensors in the interferometer.
REFERENCES:
patent: 4632551 (1986-12-01), Pavlath
patent: 4697926 (1987-10-01), Youngquist et al.
patent: 4699513 (1987-10-01), Brooks et al.
patent: 4770535 (1988-09-01), Kim et al.
patent: 4932783 (1990-06-01), Kersey et al.
Carpenter Michael M.
Gillmann Harold E.
Kirk James F.
Kurtz, II Richard E.
Litton Systems Inc.
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