Ferroelectric thin film coated substrate, producing method there

Compositions – Fluent dielectric – N-containing

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257295, 257296, 257303, 257306, 257310, H01L 2900, H01L 2976, H01L 2994, H01L 31062

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057570612

ABSTRACT:
A ferroelectric thin film coated substrate is obtained by a producing method of forming a crystalline thin film on a substrate by means of a MOCVD method at a substrate temperature at which crystal grows and of forming a ferroelectric thin film on the crystalline thin film by means of the MOCVD method at a film forming temperature, which is lower than the film forming temperature of the crystalline thin film. This producing method makes it possible to produce a ferroelectric thin film, where a surface of the thin film is dense and even, leakage current properties are excellent and sufficiently large remanent spontaneous polarization is shown, at a lower temperature.

REFERENCES:
patent: 5270298 (1993-12-01), Ramesh
patent: 5390072 (1995-02-01), Anderson et al.
patent: 5519566 (1996-05-01), Perino et al.
patent: 5548475 (1996-08-01), Ushibubo et al.
patent: 5576564 (1996-11-01), Satoh et al.
Extended Abstracts, The Japan Society of Applied Physics, The 55th Autumn Meeting, 1994 (20p-M-19).
Extended Abstracts, The Japan Society of Applied Physics, The 42nd Spring Meeting, 1995 (29p-D-2).
Extended Abstracts, The Japan Society of Applied Physics, The 42nd Spring Meeting, 1995 (29p-D-3).
Extended Abstracts, The Japan Society of Applied Physics, The 56th Autumn Meeting, 1995 (27a-ZG-2).
Extended Abstracts, The Japan Society of Applied Physics, The 56th Autumn Meeting, 1995 (27a-ZG-3).
Extended Abstracts, The Japan Society of Applied Physics, The 43rd Spring Meeting, 1996 (28p-V-11).
G.A. Smolenskii et al., Soviet Phys. Solid State, A New Group of Ferroelectrics, 1, 149-51, 1959.
E.C. Subbarao, J. Phys. Chem. Solids, A Family of Ferroelectric Bismuth Compounds, 23, 665-76, 1962.
S. Onishi et al., IEEE IEDM Technical Digest, A Half-Micron Ferroelectric Memory Cell . . . , pp. 843-846, 1994.
Takashi Nakamura, Integrated Ferroelectrics, Preparation of Bi.sub.4 Ti.sub.3 O.sub.12 Films . . . , vol. 6, pp. 35-46 (1995).
H. Matsunaga et al., Chemical Abstracts 12:248134 (1996).
Preparation of C-Axis-Oriented Bi4Ti3012 Thin Films by Metalorganic Chemical Vapor Deposition, Takashi Nakamura Extended Abstracts, et al, Jpn. J. Appl. Phys. vol. 32 (1993) pp. 4086-4088 Part 1, No. 9b, Sep. 1993.
Ultra-Thin Fatique Free Bi4Ti3012 Thin Film for Nonvolatile Ferroelectric Memories T. Kijima et al, Extended Abstracts of the 1995 International Conference on Solid State Devices and Materiala, Osaka, 1995, pp. 1071-1072.
Ultra-Thin Fatique-Free Bi4Ti3012 Films for nonvolatile Ferroelectric Memories, Takeshi Kijima et al, Jpn. J. Appl. Phys. vol. 35 (1996) pp. 1246-1250, Part 1, No. 2B, Feb. 1996.
Preparation of B14Ti3012 Thin Films with c-axis Orientation by MOCVD Using Bi(o0C7H7)3 and Ti (i-Oc3H7) 2 (DPM)2, Kuniaki Yoshimura et al, Journals
Thin Solid Films, vol. 259, No. 2, pp. 264-269, XP000512226 JIA Q X et al: "Low Leakagge Current BAT103 Thin Film Capacitors Using a Multilayer Construction", Apr. 15, 1995.
Japanese Journal of Applied Physics, vol. 32, No. 98, pp. 4086-4088, XP000573227, Nakamura T. et al., "Preparation of C-Axis-Oriented B14T13012 Thin Films by Metalorganic Chemical Vapor Deposition", Sep. 1, 1993.

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