Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-03-23
2008-12-02
Menz, Douglas M (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S751000
Reexamination Certificate
active
07459738
ABSTRACT:
A ferroelectric memory element has a memory cell array including memory cells arranged in a matrix configuration, each of the memory cells having a lower electrode, an upper electrode arranged in a direction intersecting the lower electrode, and a ferroelectric layer disposed at least in an intersecting area between the upper electrode and the lower electrode, wherein a hydrogen barrier film and a hydrogen barrier film are arranged at least below the memory cell array, and a bottom hydrogen barrier film is arranged below the memory cell array.
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Kobayashi Koichi
Tamura Hiroaki
Harness & Dickey & Pierce P.L.C.
Menz Douglas M
Seiko Epson Corporation
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