Static information storage and retrieval – Systems using particular element – Ferroelectric
Reexamination Certificate
2007-05-08
2007-05-08
Ho, Hoai V. (Department: 2827)
Static information storage and retrieval
Systems using particular element
Ferroelectric
C365S117000
Reexamination Certificate
active
11216078
ABSTRACT:
To provide a nondestructive-read ferroelectric memory capable of realizing high speed, high integration, and long service life.The present invention is provided with an MFSFET100having a ferroelectric thin film at its gate portion, word line104, bit line105, and bit line106so as to apply voltage equal to or higher than the coercive electric field of the ferroelectric thin film between the bit line105and the word line104at first write timing and apply voltage equal to or higher than the coercive electric field between the bit line106and the word line104at second write timing, and applies voltage equal to or lower than the coercive electric field of the ferroelectric thin film between the bit line105and the word line104at first read timing to detect the current flowing between the both bit lines, and applies voltage equal to or lower than the coercive electric field between the bit line106and the word line104at second read timing to detect the current flowing between the both bit lines.
REFERENCES:
patent: 5515311 (1996-05-01), Mihara
patent: 5530667 (1996-06-01), Omura et al.
patent: 5986724 (1999-11-01), Akiyama et al.
patent: 6236076 (2001-05-01), Arita et al.
patent: 6356475 (2002-03-01), Tamura et al.
patent: 6440624 (2002-08-01), Nihei
patent: 6812509 (2004-11-01), Xu
patent: 2002/0125515 (2002-09-01), Joo et al.
patent: 2004/0224180 (2004-11-01), Kijima et al.
patent: A 2-198094 (1990-08-01), None
patent: A 5-82800 (1993-04-01), None
patent: A 11-39882 (1999-02-01), None
Hashimoto Masami
Karasawa Junichi
Kijima Takeshi
Ueno Mayumi
Ho Hoai V.
Oliff & Berridg,e PLC
Seiko Epson Corporation
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