Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-03-15
2005-03-15
Nelms, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S301000, C257S303000
Reexamination Certificate
active
06867447
ABSTRACT:
Semiconductor devices and ferroelectric memory cells therefor are provided, where the cells include a ferroelectric capacitor with one or more corners, as well as a transistor. Conductive bitline structures are located near the corners of ferroelectric cell capacitors to facilitate increased memory cell density and/or to increase capacitor area within a given cell area. Methods are disclosed for fabricating semiconductor devices with ferroelectric memory cells, wherein bitline structures are located near one or more corners of the ferroelectric cell capacitors.
REFERENCES:
patent: 5198384 (1993-03-01), Dennison
patent: 6444542 (2002-09-01), Moise et al.
patent: 6710385 (2004-03-01), Takashima
patent: 6730950 (2004-05-01), Seshadri et al.
Brady III W. James
Garner Jacqueline J.
Hoang Quoc
Nelms David
LandOfFree
Ferroelectric memory cell and methods for fabricating the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Ferroelectric memory cell and methods for fabricating the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ferroelectric memory cell and methods for fabricating the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3447108