Ferroelectric element and method for manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S296000

Reexamination Certificate

active

06979847

ABSTRACT:
In a ferroelectric element, the ferroelectric film is prevented from deteriorating and the interconnect film from lowering in reliability. A ferroelectric element comprises a first electrode, a ferroelectric film formed on the first electrode, a second electrode formed on the ferroelectric film, a first hydrogen blocking film formed directly on a surface of the second electrode, a first insulation film formed on the first hydrogen blocking film, a first opening formed in the first hydrogen blocking film exposing a part of the second electrode, a second opening formed in the first insulation film and having a greater diameter than the diameter of the first opening, and an interconnect film connected to the second electrode through the first and second openings.

REFERENCES:
patent: 2002/0021544 (2002-02-01), Cho et al.
patent: 2004/0183112 (2004-09-01), Okita
patent: 11-121704 (1999-04-01), None
patent: 2002-305288 (2002-10-01), None

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