Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate
2005-12-30
2009-06-09
Nguyen, Van Thu (Department: 2824)
Static information storage and retrieval
Read/write circuit
Differential sensing
C365S145000, C365S148000
Reexamination Certificate
active
07545696
ABSTRACT:
A ferro-electric memory device suppresses deterioration of retention characteristics at the time when an ambient temperature has decreased, without requiring a much longer cycle time. The ferro-electric memory device includes a first ferro-electric capacitor for use in a first normal cell and a second ferro-electric capacitor for use in a second normal cell. The ferro-electric memory device also includes: a temperature detection circuit which detects an ambient temperature of the first and second normal cells; and a normal cell power supply switching circuit which switches a voltage to be applied to the first and second ferro-electric capacitors depending on the detected temperature.
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English language Abstract of JP 2003-59251.
Greenblum & Bernstein P.L.C.
Nguyen Van Thu
Panasonic Corporation
Yang Han
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