Fault tolerant data storage circuit

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S724000

Reexamination Certificate

active

10453160

ABSTRACT:
A fault tolerant data storage circuit for an integrated circuit produces a specified initial output state with high probability even in the presence of abnormal start-up conditions affecting one or more signal inputs to the storage circuit. The storage circuit includes a plurality of storage elements, such as flip-flops, latches, or static RAM cells, each acting as a redundant element for the others. The storage elements are constructed to normally assume a preferred initial state. All storage elements are clocked by a common clock line and loaded at their data inputs from a common data input line of the storage circuit. A logic gate, such as an AND gate combines the storage element outputs and outputs the correct initial state, unless all storage elements happen to be in the wrong state, which is an extremely low probability event.

REFERENCES:
patent: 4396996 (1983-08-01), Oldham
patent: 5572620 (1996-11-01), Reilly et al.
patent: 5799022 (1998-08-01), Williams
patent: 5923512 (1999-07-01), Brownlow et al.
patent: 5993055 (1999-11-01), Williams
patent: 6104211 (2000-08-01), Alfke
patent: 6144604 (2000-11-01), Haller et al.
patent: 6289477 (2001-09-01), Gunadisastra
patent: 6359477 (2002-03-01), Pathak
patent: 6446229 (2002-09-01), Merrick et al.
patent: 6484271 (2002-11-01), Gray
patent: 2002/0180500 (2002-12-01), Okuda et al.
patent: 57098197 (1982-06-01), None
Cioaca et al., “A Million-Cycle CMOS 256K EEPROM”, IEEE Journal of Solid-State Circuits, vol., SC-22, No. 5, Oct. 1, 1987, pp. 684-692.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Fault tolerant data storage circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Fault tolerant data storage circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fault tolerant data storage circuit will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3885448

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.