Fault tolerant asynchronous circuits

Details Fault tolerant asynchronous circuits Fault tolerant asynchronous circuits

2008-09-29

2010-06-22

Cho, James (Department: 2819)

Electronic digital logic circuitry

Reliability

C326S015000

Reexamination Certificate

active

07741864

ABSTRACT:
New and improved methods and circuit designs for asynchronous circuits that are tolerant to transient faults, such as the type introduced through radiation or, more broadly, single-event effects (SEEs). SEE-tolerant configurations are shown and described for combinational logic circuits, state-holding logic circuits and SRAM memory circuits, among others.

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