Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate
2005-08-09
2005-08-09
Tu, Christine T. (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Replacement of memory spare location, portion, or segment
C714S723000
Reexamination Certificate
active
06928591
ABSTRACT:
A controller for repairing a redundant memory circuit includes a fault storage matrix for mapping a repair solution, a plurality of registers for storing row and column coordinates of the repair solution, and a repair solution calculator coupled to the plurality of registers and the fault storage matrix for receiving an x-coordinate and a y-coordinate of a defective memory cell in the redundant memory circuit and for determining whether a repair solution may be found from the fault storage matrix.
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patent: 6795942 (2004-09-01), Schwarz
patent: 2003/0101389 (2003-05-01), Rieger
John R. Day, “A Fault-Driven, Comprehensive Redundancy Algorithm”, International Test Conference 1984, Jun. 1985, pps. 35-44.
Wei Kang Huang et al., “New Approaches for the Repairs of Memories with Redundancy by Row/Column Deletion for Yield Enhancement”, IEEE Transactions On Computer-Aided Design, vol. 9, No. 3, Mar. 1990, pps. 323-328.
Agrawal Ghasi R.
Grinchuk Mikhail I.
Scepanovic Ranko
Fitch Even Tabin & Flannery
LSI Logic Corporation
Tu Christine T.
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