Fault isolation of circuit defects using comparative...

Details Fault isolation of circuit defects using comparative... Fault isolation of circuit defects using comparative...

2006-03-28

2006-03-28

Patidar, Jay (Department: 2862)

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

C324S248000, C324S765010, C324S750010

Reexamination Certificate

active

07019521

ABSTRACT:
Circuit flaws in microelectronic circuitry present regions of high resistance in which a current distribution deviates from that of a defect-free circuit. The altered current distribution emits a correspondingly altered magnetic field in accordance with Ampere's Law. When compared with the magnetic field of a defect-free circuit, the anomaly in the magnetic field of the defective device is detected and the location of the circuit flaw may be determined therefrom. As the anomaly in the magnetic field is very small in magnitude, a sensitive magnetic microscope is utilized to obtain images of the magnetic fields of a defect-free reference device and a device-under-test. The distance between the magnetic sensor and the devices being scanned is precisely controlled to minimize influences of scanning distance on the difference in measured magnetic field strength. Comparative image analysis reveals the location of the circuit flaw. Maximal image registration through image interpolation, displacement and resampling optimizes the comparative image analysis.

REFERENCES:
patent: 6433572 (2002-08-01), Birdsley et al.
patent: 6657431 (2003-12-01), Xiao
patent: 6759259 (2004-07-01), Nikawa
patent: 6930479 (2005-08-01), Xiao et al.
patent: 2004/0207396 (2004-10-01), Xiao

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