Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-06-19
2007-06-19
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
10959389
ABSTRACT:
Identification of a faulty net in a design implemented on a programmable logic device (PLD). In one approach, configuration data is generated to implement a duplicate circuit of a failing sub-circuit in the design. The PLD is configured with the configuration data that implements the failing sub-circuit and the duplicate circuit, and at least one set of input signals is applied to the sub-circuit and the duplicate circuit. A signal from each net in the sub-circuit is compared on the PLD to a corresponding net in the duplicate circuit. In response to the signal from the net in the sub-circuit being unequal to a signal from the corresponding net in the duplicate circuit, the net in the sub-circuit is identified as faulty.
REFERENCES:
patent: 6003150 (1999-12-01), Stroud et al.
patent: 6108806 (2000-08-01), Abramovici et al.
patent: 6397362 (2002-05-01), Ishiyama
patent: 2003/0056163 (2003-03-01), Rajsuman et al.
patent: 2004/0015735 (2004-01-01), Norman
patent: 2004/0177314 (2004-09-01), Kleihorst et al.
patent: 2004/0216081 (2004-10-01), Wells et al.
McEwen Ian L.
Staab Donald Audley
Stamm Reto
Tan Phoumra
Dinh Paul
Maunu LeRoy D.
Parihar Suchin
Xilinx , Inc.
LandOfFree
Fault isolation in a programmable logic device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Fault isolation in a programmable logic device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fault isolation in a programmable logic device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3817244