Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2007-08-07
2007-08-07
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C700S108000
Reexamination Certificate
active
10947092
ABSTRACT:
An apparatus for fault detection and classification (FDC) specification management including a storage device and a process module. The storage device stores a specification management record and a chart profile record. The specification management record stores statistical algorithm settings of a parameter and the chart profile record stores chart frame and alarm condition information. The process module, which resides in a memory, receives a manipulation message corresponding to the specification management record, and accordingly manipulates the chart profile record.
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Chen Jian-Hong
Chien Wen-Sheng
Chu Chon-Hwa
Chung Chia-Hung
Lai Ie-Fun
Barlow John
Le Toan M.
Taiwan Semiconductor Manufacturing Co. Ltd.
Thomas Kayden Horstemeyer & Risley
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