Fault analyzing system, method for pursuing fault origin and...

Details Fault analyzing system, method for pursuing fault origin and... Fault analyzing system, method for pursuing fault origin and...

2005-07-05

2005-07-05

Siek, Vuthe (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

06915494

ABSTRACT:
A fault analyzing system presumes fault propagation paths for specifying nodes related to fault terminals once on plural time planes, and merges pieces of related fault terminal information representative of the fault terminals related to the nodes on different time planes in different manners so that plural list of plural kinds of fault are drawn up without repeating the time-consuming presumption.

REFERENCES:
patent: 6170078 (2001-01-01), Erle et al.
patent: 6370492 (2002-04-01), Akin
patent: 2655105 (1997-05-01), None
patent: 2921502 (1999-04-01), None

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