Fast switching power insulated gate semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S595000, C257SE29345, C257SE21364, C438S379000

Reexamination Certificate

active

08063426

ABSTRACT:
An insulated gate semiconductor device (30) includes a gate (34), a source terminal (36), a drain terminal (38) and a variable input capacitance at the gate. A ratio between the input capacitance (Cfiss) when the device is on and the input capacitance Ciisswhen the device is off is less than two and preferably substantially equal to one. This is achieved in one embodiment of the invention by an insulation layer32at the gate having an effective thickness dinslarger than a minimum thickness.

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Form PCT/ISA/210 International Search Report for International Application No. PCT/ZA2004/000005 completed Jul. 8, 2004.
Office Action for Application No. JP 2006-501327 mailed May 24, 2010 (received Jun. 15, 2010).

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