Failure prediction with two threshold levels

Details Failure prediction with two threshold levels Failure prediction with two threshold levels

2006-10-17

2006-10-17

Dildine, R. Stephen (Department: 2133)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S704000, C714S706000

Reexamination Certificate

active

07124332

ABSTRACT:
In some embodiments, a first comparator compares a first error rate and a first threshold value and a second comparator compares a second error rate and a second threshold value. Other embodiments are described and claimed.

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C.L. Chen and M.Y. Hsiao, Error-Correcting Codes for Semiconductor Memory Applications: A State-of-the-Art Review. IBM J. Res. Develop. vol. 28. No. 2. Mar. 1984.
Constantinescu. Impact of Deep Submicron Technology on Dependability of VLSI Circuits. 2002 IEEE.
Lin et al., Error Log Analysis: Statistical Modeling and Heuristic Trend Analysis. Oct. 1990 IEEE. vol. 39. No. 4. pp. 419-432.

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