Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Reexamination Certificate
2005-07-05
2005-07-05
Walke, Amanda (Department: 1752)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
Reexamination Certificate
active
06913870
ABSTRACT:
A material is deposited on a substrate by depositing a liftoff layer overlying the substrate, thereafter depositing a hard-mask layer overlying the liftoff layer, thereafter depositing an image layer in registry with a retained portion of the hard-mask layer, leaving a nonretained portion of the hard-mask layer which is not in registry with the image layer. The method further includes removing the nonretained portion of the hard-mask layer, removing at least a part of the thickness of the image layer, and removing a nonretained portion of the liftoff layer, which may include an undercut under the hard-mask layer. The deposited material is deposited onto the substrate from a source, and the retained portion of the hard-mask layer and any part of the liftoff layer remaining between the hard-mask layer and the substrate is thereafter removed.
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Renaldo Alfred Floyd
Werner Douglas Johnson
International Business Machines - Corporation
Kotab Dominic M.
Walke Amanda
Zilka-Kotab, PC
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