Eye width characterization mechanism

Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

10930202

ABSTRACT:
An eye width characterization mechanism determines a pass setting of a sampling phase positioned within an eye width of received data. The sampling phase is incremented in a first direction from the pass setting until the sampling phase is outside the eye width of the received data. The sampling phase is then incremented in an opposite direction of the first direction starting again from the pass setting until the sampling phase is outside the eye width of the received data. The number of the sampling phase increments in the first direction is added to the number of the sampling phase increments in the opposite direction to characterize the eye width of the received data.

REFERENCES:
patent: 5654987 (1997-08-01), Nakamura
patent: 6263034 (2001-07-01), Kanack et al.
patent: 6990418 (2006-01-01), Blanc et al.
patent: 2005/0188284 (2005-08-01), Proano et al.
patent: 2005/0259764 (2005-11-01), Hung Lai et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Eye width characterization mechanism does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Eye width characterization mechanism, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Eye width characterization mechanism will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3811293

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.