Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction
Reexamination Certificate
2007-05-29
2007-05-29
Kerveros, James C (Department: 2138)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Skew detection correction
Reexamination Certificate
active
10930202
ABSTRACT:
An eye width characterization mechanism determines a pass setting of a sampling phase positioned within an eye width of received data. The sampling phase is incremented in a first direction from the pass setting until the sampling phase is outside the eye width of the received data. The sampling phase is then incremented in an opposite direction of the first direction starting again from the pass setting until the sampling phase is outside the eye width of the received data. The number of the sampling phase increments in the first direction is added to the number of the sampling phase increments in the opposite direction to characterize the eye width of the received data.
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Chow Kim Kee
Jain Sunil K.
Blakely , Sokoloff, Taylor & Zafman LLP
Intel Corporation
Kerveros James C
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