Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Optimization
Reexamination Certificate
2011-08-30
2011-08-30
Levin, Naum (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Optimization
C703S002000
Reexamination Certificate
active
08010930
ABSTRACT:
A method, apparatus and program product are provided for extracting parameters for compact models for semiconductor devices. A first set of parameters associated with first and second semiconductor devices is defined and has the same value for all devices. A second set of parameters associated with the semiconductor devices is defined having values that differ among the devices. Data is measured from the semiconductor devices related to the first and second set of parameters. A mathematical relationship is established between the measured data, and the values of the second set of parameters are adjusted to fit the established mathematical relationship. The mathematical relationship may also be a correlation of the measured data from the first semiconductor device with the measured data from the second semiconductor device creating a data set for parameter extraction. Parameters may then be extracted from the data set related to the first and second semiconductor devices.
REFERENCES:
patent: 4759675 (1988-07-01), Bond et al.
patent: 5379232 (1995-01-01), Komoda
patent: 5396615 (1995-03-01), Tani
patent: 5543334 (1996-08-01), Yoshii et al.
patent: 5651099 (1997-07-01), Konsella
patent: 5687355 (1997-11-01), Joardar et al.
patent: 5867398 (1999-02-01), Scepanovic et al.
patent: 5994912 (1999-11-01), Whetsel
patent: 6314390 (2001-11-01), Bittner et al.
patent: 6356861 (2002-03-01), Singhal et al.
patent: 6430729 (2002-08-01), Dewey et al.
patent: 6446022 (2002-09-01), Coss, Jr. et al.
patent: 6577993 (2003-06-01), Sakamoto
patent: 6594594 (2003-07-01), Tsai
patent: 6934671 (2005-08-01), Bertsch et al.
patent: 7089512 (2006-08-01), Iadanza et al.
patent: 7099808 (2006-08-01), Suaya et al.
patent: 7263477 (2007-08-01), Chen et al.
patent: 7289859 (2007-10-01), Miwa et al.
patent: 7305332 (2007-12-01), Lee et al.
patent: 7353473 (2008-04-01), Pino et al.
patent: 7624079 (2009-11-01), Hartman et al.
patent: 2003/0114944 (2003-06-01), Bernstein et al.
patent: 2003/0220779 (2003-11-01), Chen et al.
patent: 2005/0086033 (2005-04-01), Chen et al.
patent: 2006/0282802 (2006-12-01), Yechuri
patent: 2007/0261011 (2007-11-01), Pino et al.
patent: 2009/0187525 (2009-07-01), Agrawal et al.
patent: 2010/0099033 (2010-04-01), Cohen
patent: 2010/0217568 (2010-08-01), Takeuchi
patent: 2001148469 (2001-05-01), None
patent: 2007016183 (2007-02-01), None
Trombley et al., “Methods to Select Devices for Device Model Extractions”, U.S. Appl. No. 12/031,374, filed Feb. 14, 2008.
Trombley Henry W.
Watts Josef S.
International Business Machine Corporation
Levin Naum
Wood Herron & Evans LLP
LandOfFree
Extracting consistent compact model parameters for related... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Extracting consistent compact model parameters for related..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Extracting consistent compact model parameters for related... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2655802