Extensible IO testing implementation

Details Extensible IO testing implementation Extensible IO testing implementation

2007-10-16

2007-10-16

Lin, Sun James (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

10417007

ABSTRACT:
A library useable to facilitate testing of IO cells of an ASIC. The library includes IO cell identifications and test structures associated with the IO cell identifications, and identifies which test structures are required to test which IO cells. Preferably, the library forms part of an ASIC design system. A method of testing IO cells of an ASIC is also provided, and includes using the library to determine which test structures to use to test the IO cells, and testing the IO cells using the test structures.

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