Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-06-12
2007-06-12
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
10790688
ABSTRACT:
A method and computer program for testing a design of a circuit comprises providing a model of the design; providing a first property for the design, wherein the first property describes a first behavior; checking the model using the first property and an environment of the design at a reset state until an example of the first behavior occurs; providing a second property for the design, wherein the second property describes a second behavior; and checking the model using the second property and an environment of the design at a state when the example of the first behavior occurs.
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Chiang Jack
Dimyan Magid Y.
Marvell Semiconductor Israel Ltd.
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