X-ray or gamma ray systems or devices – Specific application – Lithography
Patent
1997-01-21
2000-11-07
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Lithography
378 35, H01L 2130
Patent
active
061447196
ABSTRACT:
An exposure method including the steps of providing a wafer and a mask having a membrane and a pattern formed thereon, arranging the mask and the wafer opposite to each other, obtaining information corresponding to deformation of the membrane of the mask, reducing the influence of the deformation of the membrane, and transferring the pattern of the mask to the wafer by exposing the mask to radiant energy. Also disclosed is an exposure device for performing this exposure method.
REFERENCES:
patent: 4385434 (1983-05-01), Zehnpfennig et al.
patent: 4475223 (1984-10-01), Taniguchi et al.
patent: 5333167 (1994-07-01), Iizuka et al.
patent: 5604779 (1997-02-01), Amemiya et al.
Hasegawa Takayuki
Tanaka Yutaka
Canon Kabushiki Kaisha
Porta David P.
LandOfFree
Exposure method, exposure device and device producing method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Exposure method, exposure device and device producing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Exposure method, exposure device and device producing method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1649091