X-ray or gamma ray systems or devices – Specific application – Lithography
Patent
1990-10-01
1992-08-11
Howell, Janice A.
X-ray or gamma ray systems or devices
Specific application
Lithography
378 35, 73 40, G21K 500
Patent
active
051386437
ABSTRACT:
An exposure apparatus includes a chamber for placing an article in a predetermined ambience; a holding device for holding the article in the chamber; a fluid supplying device for supplying a temperature adjusting fluid into the holding device through a flow passageway; a detecting device for detecting leakage of the fluid from the flow passageway; and a flow rate controlling device for controlling the flow rate of the fluid to be supplied to the holding device on the basis of the detection by the detecting device.
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Okada, et al., "Development of Highly Reliable Synchrotron Radiation Lithography Beamline," J. Vac. Sci. Techol. B6(1), Jan./Feb. 1988, pp. 191 through 194.
Amemiya Mitsuaki
Ebinuma Ryuichi
Sakamoto Eiji
Uda Koji
Uzawa Shunichi
Canon Kabushiki Kaisha
Chu Kim-Kwok
Howell Janice A.
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