Exploitive test pattern apparatus and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing

Reexamination Certificate

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C714S713000, C714S716000, C714S724000, C714S733000, C714S734000, C714S738000, C714S739000, C714S025000, C714S030000, C375S224000, C375S221000

Reexamination Certificate

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11121152

ABSTRACT:
Communications equipment can be tested using a test pattern that is modified compared to, and more exploitive than, a standard test pattern. Test patterns can be employed that have lengthened or shortened consecutive identical digit (CID) portions, or that have lengthened or shortened pseudo random bit sequence (PRBS) portions. In some cases, PRBS polynomials are not re-seeded after each CID. Further, different order polynomials can be employed for different applications. Exemplary applications can include test equipment and built-in self-test capability for integrated circuits.

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