Event measuring apparatus and method, computer readable...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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C702S187000, C714S704000

Reexamination Certificate

active

07020808

ABSTRACT:
An apparatus which can collect information for a long time or collect information on an entire memory space with a small hardware physical quantity while avoiding unnecessary overhead. The apparatus comprises a counting unit for counting the number of events having occurred in a processor or a computer system, a retaining unit for retaining a count value obtained by the counting unit, and a control unit for controlling writing of a count value into the retaining unit, wherein the control unit controls the writing so as to write a new count value obtained by the counting unit in said retaining unit while leaving a count value of a high degree of significance in the retaining unit. The apparatus is used to measure the number of events having occurred in the processor when the performance of the processor or the a computer system is measured or tuned.

REFERENCES:
patent: 4339657 (1982-07-01), Larson et al.
patent: 4845615 (1989-07-01), Blasciak
patent: 5301240 (1994-04-01), Stockum et al.
patent: 5530705 (1996-06-01), Malone, Sr.
patent: 5606563 (1997-02-01), Dorbolo et al.
patent: 5796939 (1998-08-01), Berc et al.
patent: 6263458 (2001-07-01), Miller et al.
patent: 6282173 (2001-08-01), Isonuma et al.
patent: 6577961 (2003-06-01), Holdsclaw et al.
patent: 6591383 (2003-07-01), Michel et al.
patent: 6694288 (2004-02-01), Smocha et al.
patent: 6721909 (2004-04-01), Butler
patent: 6785851 (2004-08-01), Franck et al.
patent: HEI 10-260869 (1998-09-01), None

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