Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reissue Patent
2006-06-08
2008-12-02
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reissue Patent
active
RE040597
ABSTRACT:
An evaluation TEG for evaluating a semiconductor device including an SOI structure and a LOCOS having a birdbeak portion comprises two electrodes10and20having different electrode widths sufficiently large to disregard the length of the LOCOS birdbeak portion and an electrode30having an extremely small width substantially equal to the length of the birdbeak portion. All the electrode have the same length and are connected to test pads10a,20a, and30a, respectively. The capacitance of a parasitic transistor is easily extracted by using the evaluation TEG and the evaluation of parameters causing the hump characteristics is become possible.
REFERENCES:
patent: 5388055 (1995-02-01), Tanizawa et al.
patent: 6470479 (2002-10-01), Yamamoto
patent: 6530066 (2003-03-01), Ito et al.
patent: 2006/0129955 (2006-06-01), Jacobsen et al.
patent: 7-260867 (1995-10-01), None
Dinh Paul
Kubotera & Associates LLC
Oki Electric Industry Co. Ltd.
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