Evaluation of memory cell characteristics

Details Evaluation of memory cell characteristics Evaluation of memory cell characteristics

1997-08-14

1999-09-28

Nguyen, Viet Q.

Static information storage and retrieval

Floating gate

Particular biasing

36518529, 365218, 36518521, 3651853, G11C 700

Patent

active

059598913

ABSTRACT:
Techniques are used to evaluate margin of programmable memory cells. In particular, techniques are used to measure negative erased threshold voltage levels. Techniques are used to increase the longevity and reliability of memory cells by adjusting a window of memory cell operation.

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